Paiboon Tangyunyong: search on Z-Library

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1

Local thermal probing to detect open and shorted IC interconnections

Edward I. Cole Jr., Paiboon Tangyunyong, Daniel L. Barton

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 440 KB

english, 1999

2

Frequency dependence of the lifetime of a surface micromachined microengine driving a load

Danelle M Tanner, William M Miller, Ken A Peterson, Michael T Dugger, William P Eaton, Lloyd W Irwin, Donna C Senft, Norman F Smith, Paiboon Tangyunyong, Samuel L Miller

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 1.73 MB

english, 1999

3

Thermal modeling of localized laser heating in multi-level interconnects

Paiboon Tangyunyong

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 722 KB

english, 2003

4

[IEEE 2014 IEEE 40th Photovoltaic Specialists Conference (PVSC) - Denver, CO, USA (2014.6.8-2014.6.13)] 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) - Stress factor assessment for microsystems-enabled photovoltaics

Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Tangyunyong, Paiboon, Okandan, Murat, Nielson, Gregory N.

Year:

2014

Language:

english

File:

PDF, 772 KB

english, 2014

5

Characterization of electrically-active defects in ultraviolet light-emitting diodes with laser-based failure analysis techniques

Miller, Mary A., Tangyunyong, Paiboon, Cole, Edward I.

Journal:

Journal of Applied Physics

Year:

2016

Language:

english

File:

PDF, 1.02 MB

english, 2016

6

Identification of radiation-induced parasitic leakage paths using light emission microscopy

Shaneyfelt, M.R., Paiboon Tangyunyong,, Hill, T.A., Soden, J.M., Flores, R.S., Schwank, J.R., Dodd, P.E., Hash, G.L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2004

Language:

english

File:

PDF, 737 KB

english, 2004

7

SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Monday 18 September 2000)] MEMS Reliability for Critical Applications - Electrostatic discharge/electrical overstress susceptibility in MEMS: a new failure mode

Walraven, Jeremy A., Soden, Jerry M., Tanner, Danelle M., Tangyunyong, Paiboon, Cole, Jr., Edward I., Anderson, Richard E., Irwin, Lloyd W., Lawton, Russell A.

Year:

2000

Language:

english

File:

PDF, 1.80 MB

english, 2000

8

Failure Analysis Techniques for Microsystems-Enabled Photovoltaics

Yang, Benjamin B., Cruz-Campa, Jose L., Haase, Gaddi S., Cole, Edward I., Tangyunyong, Paiboon, Resnick, Paul J., Kilgo, Alice C., Okandan, Murat, Nielson, Gregory N.

Journal:

IEEE Journal of Photovoltaics

Year:

2014

Language:

english

File:

PDF, 709 KB

english, 2014

9

SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Sunday 20 September 1998)] Materials and Device Characterization in Micromachining - Linkage design effect on the reliability of surface-micromachined microengines driving a load

Tanner, Danelle M., Peterson, Kenneth A., Irwin, Lloyd W., Tangyunyong, Paiboon, Miller, William M., Eaton, William P., Smith, Norman F., Rodgers, M. Steven, Friedrich, Craig R., Vladimirsky, Yuli

Year:

1998

Language:

english

File:

PDF, 1.29 MB

english, 1998

10

SPIE Proceedings [SPIE Micromachining and Microfabrication - Santa Clara, CA (Sunday 20 September 1998)] Materials and Device Characterization in Micromachining - Failure analysis of surface-micromachined microengines

Peterson, Kenneth A., Tangyunyong, Paiboon, Pimentel, Alejandro A., Friedrich, Craig R., Vladimirsky, Yuli

Year:

1998

Language:

english

File:

PDF, 1.93 MB

english, 1998

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